#FailureAnalysis
Before you head to #ISTFA2025, join us for a webinar to preview our new optical capabilities designed for #FailureAnalysis.

📆 November 6
🕓 4:00 PM PST
🎤 Keith Serrels

Register here 🔗 https://ow.ly/P9of50XeiEj

Meet up with the Hamamatsu team at ISTFA 2025, booth 201, to further discuss.
October 22, 2025 at 3:50 PM Everybody can reply
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When it comes to #semiconductor #FailureAnalysis, precision isn’t optional. That’s why our engineers developed TD Imaging for complex structures.

Learn more about the advantages of this new technique — and talk to our team about TD Imaging live at #ISTFA2025! https://ow.ly/Iwon50X2tcT
October 13, 2025 at 2:45 PM Everybody can reply
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#Demo alert! Hamamatsu is now accepting requests for ThermoDynamic Imaging (TD Imaging) demos!
👉 Request your personalized demo here: ow.ly/rrie50W94Yn
#FailureAnalysis #SemiconductorTesting #ThermalImaging #Hamamatsu
June 26, 2025 at 8:03 PM Everybody can reply
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Article dissects BNFs calamitous "Big Bang" update – from communication breakdowns to security nightmares. medium.com/@chribonn/bn...

#BNF #BNFBankMalta #ITProjectManagement #FailureAnalysis #BankingInnovation #MaltaNews #TechFails #MFSA #TTMO
BNF Bank’s Gone Wrong System Update
Introduction
medium.com
June 24, 2025 at 1:53 PM Everybody can reply
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7月10日(木)13:00-17:00に、神奈川県立産業技術総合研究所 #KISTEC が『不具合原因の分析と対応力向上セミナー』を開催。川崎市高津区・かながわサイエンスパークにて。案内と申込は bit.ly/4jGewc6 から。リーフレット(PDF)は bit.ly/4jB4DfH に。
#Seminar #FailureAnalysis
KISTEC|(地独)神奈川県立産業技術総合研究所
品質管理担当の方、新入社員の方にも最適な講座です。様々な製品不具合に関する相談・分析経験の豊富な職員が、実例を交えながら、対応の重要ポイントを解説します。
bit.ly
June 10, 2025 at 4:18 AM Everybody can reply
Failure ≠ final. It’s feedback.
Top entrepreneurs treat setbacks like data.

✅ Analyze what/why it failed
✅ Seek diverse, honest feedback
✅ Refine & test systems

Failure’s inevitable—poor learning isn’t.
How do you turn setbacks into strategy?
#Entrepreneurship #FailureAnalysis
May 31, 2025 at 8:53 PM Everybody can reply
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The reliability of rocket launches is constantly improving, but failures still occur. These failures often lead to valuable lessons learned and improvements in design, materials, and testing procedures for future missions. #RocketReliability #FailureAnalysis #ContinuousImprovement
May 12, 2025 at 7:00 PM Everybody can reply
Lock-in Thermography has long been a staple in #FailureAnalysis. Now, with industry trends like stacked memory, our new Thermal Dynamic Imaging technique at 670 & 1300 nm boosts resolution + speed—enhancing defect localization and SNR. bit.ly/3YD6j0J

#SemiconductorTesting #ThermalImaging
May 8, 2025 at 3:01 PM Everybody can reply
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3月25日(火)13:15-17:00に、電子情報技術産業協会 #JEITA が「JEITA・オンライン『半導体故障解析手順と用語集(第1版)追補版』発行記念 半導体故障解析セミナー」を開催。案内は https://buff.ly/4g2vNub に。東京都千代田区・JEITA会議室およびオンラインにて。
#Seminar #Semiconductor #FailureAnalysis
January 19, 2025 at 11:50 PM Everybody can reply